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Kenan Šehić, H. Bredmose, J. Sørensen, M. Karamehmedović

M. Karamehmedović, Kenan Šehić, B. Dammann, M. Suljagić, Emir Karamehmedovic

We demonstrate that a single 6mm line sample of simulated near-field speckle intensity suffices for accurate estimation of the concentration of dielectric micro-particles over a range from 104 to 6⋅106 particles per ml. For this estimation, we analyze the speckle using both standard methods (linear principal component analysis, support vector machine (SVM)) and a neural network, in the form of a sparse stacked autoencoder (SSAE) with a softmax classifier or with an SVM. Using an SSAE with SVM, we classify line speckle samples according to particle concentration with an average accuracy of over 78%, with other methods close behind.

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