PHYSICAL BACKGROUND OF MEASUREMENT TECHNIQUES IN ADVANCED TECHNOLOGIES
The basic and to a certain level acceptable explanation of the physical processes that underlie the fundamental working function /mode/ many measurement techniques is provided. These are actually the physical processes that enable the functioning of many modern measuring/technical instruments, which are widely used in scientific laboratories and today's technologies. Examples of those are electrical sensors found in circuits, magnetic field sensors, specific mechanical sensors, mass flow and stress/strain sensors, various interferometers and spectrometers (Laser Doppler anemometers (LDA, PDA, CTA)), atomic force microscope (AFM) and scanning tunneling microscope (STM) used for exploring properties of materials etc. Special attention is paid to some of the phenomena used in crystallography, to commemorate the centennial of Nobel Prize in Physics “for the discovery of the diffraction of X-rays by crystals”, given to Max von Laue, as well as to the measurement techniques for environmental issues research.