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24. 10. 2001.
Near-field Mie scattering in optical trap nanometry
A mathematical model for understanding near-field Mie scattering, as used in optical trap nanomery for single molecule detection, is developed. Both perpendicular and parallel polarization states of incident electromagnetic waves have been considered. Simulations under different incident angles, and refractive indices of trapped particle have been investigated. Half-space signal strength is studied on the base of the calculated three-dimensional scattered electromagnetic field.